High-density high-speed CMOS and BiCMOS technologies are today widely used for the design of readout integrated circuits for room-temperature X- and gamma-ray imaging detectors. This paper describes a laboratory instrument that was developed to characterize the noise performances of CMOS devices to be used for high-speed analog signal processing. This instrument extends the noise-measuring capabilities beyond 100 MHz to detect the white noise component beyond the 1/f noise corner frequency, which in shorter channel devices shifts to higher values as compared to long-channel transistors.

(2002). Instrumentation for noise measurements on CMOS transistors for fast detector preamplifiers [journal article - articolo]. In IEEE TRANSACTIONS ON NUCLEAR SCIENCE. Retrieved from http://hdl.handle.net/10446/111212

Instrumentation for noise measurements on CMOS transistors for fast detector preamplifiers

Manghisoni, Massimo;Ratti, Leonardo;Re, Valerio;
2002-01-01

Abstract

High-density high-speed CMOS and BiCMOS technologies are today widely used for the design of readout integrated circuits for room-temperature X- and gamma-ray imaging detectors. This paper describes a laboratory instrument that was developed to characterize the noise performances of CMOS devices to be used for high-speed analog signal processing. This instrument extends the noise-measuring capabilities beyond 100 MHz to detect the white noise component beyond the 1/f noise corner frequency, which in shorter channel devices shifts to higher values as compared to long-channel transistors.
journal article - articolo
2002
Manghisoni, Massimo; Ratti, Leonardo; Re, Valerio; Speziali, V.
(2002). Instrumentation for noise measurements on CMOS transistors for fast detector preamplifiers [journal article - articolo]. In IEEE TRANSACTIONS ON NUCLEAR SCIENCE. Retrieved from http://hdl.handle.net/10446/111212
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10446/111212
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