The SIRAD irradiation facility at LNL

SIRAD is the irradiation facility at the Tandem XTU accelerator of the INFN National Laboratory of Legnaro (Padova, Italy) dedicated to study radiation effects, both comulative and Single Event, on silicon detectors and microelectronic devices and systems. SIRAD is routinely used by various research groups involved in the development of semiconductor detectors and electronics to be used in radiation hostile environments as experiments at high-energy/high luminosity accelerators or in space, or interested to study the basic radiation damage mechanisms. Single Events Effects (SEE) studies with micrometric resolution can be performed at SIRAD thanks to an Ion Electron Emission Microscope (IEEM) inserted at the end of the beam line. Here we describe the SIRAD facility including the available and future beam characteristics, and the IEEM performances as well as the scientific and technological solutions which have been implemented for its construction.