Structural studies of tungsten-titanium oxide thin films grown on alumina substrates have been performed on samples prepared by reactive magnetron sputtering of a W/Ti alloy (90% W and 10% Ti). Structural changes undergone by samples heated at 773 and 1073 K have been studied by using X-ray diffraction and X-ray photoemission techniques. The results, which have been also discussed with the aid of a structural model, indicate that the original amorphous phase transforms by annealing into a crystalline phase of tungsten oxide with a degree of order depending on the annealing temperature. The relationship between titanium and the structure of the film is discussed in terms of disorder effects induced by the Ti ions in the WO3lattice. The ordering is ascribed to the segregation of Ti ions toward the surface upon annealing at 1073 K.

(1996). Structural studies of tungsten-titanium oxide thin films [journal article - articolo]. In JOURNAL OF SOLID STATE CHEMISTRY. Retrieved from http://hdl.handle.net/10446/131010

Structural studies of tungsten-titanium oxide thin films

Natali Sora, Isabella;
1996-01-01

Abstract

Structural studies of tungsten-titanium oxide thin films grown on alumina substrates have been performed on samples prepared by reactive magnetron sputtering of a W/Ti alloy (90% W and 10% Ti). Structural changes undergone by samples heated at 773 and 1073 K have been studied by using X-ray diffraction and X-ray photoemission techniques. The results, which have been also discussed with the aid of a structural model, indicate that the original amorphous phase transforms by annealing into a crystalline phase of tungsten oxide with a degree of order depending on the annealing temperature. The relationship between titanium and the structure of the film is discussed in terms of disorder effects induced by the Ti ions in the WO3lattice. The ordering is ascribed to the segregation of Ti ions toward the surface upon annealing at 1073 K.
articolo
1996
Depero, Laura Eleonora; Groppelli, Silvio; NATALI SORA, Isabella; Sangaletti, Luigi; Sberveglieri, Giorgio; Tondello, Eugenio
(1996). Structural studies of tungsten-titanium oxide thin films [journal article - articolo]. In JOURNAL OF SOLID STATE CHEMISTRY. Retrieved from http://hdl.handle.net/10446/131010
File allegato/i alla scheda:
File Dimensione del file Formato  
1-s2.0-S0022459696900511-main.pdf

Solo gestori di archivio

Versione: publisher's version - versione editoriale
Licenza: Licenza default Aisberg
Dimensione del file 334.22 kB
Formato Adobe PDF
334.22 kB Adobe PDF   Visualizza/Apri
Pubblicazioni consigliate

Aisberg ©2008 Servizi bibliotecari, Università degli studi di Bergamo | Terms of use/Condizioni di utilizzo

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10446/131010
Citazioni
  • Scopus 55
  • ???jsp.display-item.citation.isi??? 53
social impact