This work concerns the design of a temperature sensor for multi-purpose pattern recognition applications de- signed in a 28 nm CMOS technology. The sensor resolution is 1°C between −40°C and 125°C. A vertical bipolar transistor is used as the sensing element generating the reference for the Analog-to-Digital Converter (ADC), based on a dual slope, Wilkinson architecture. An auto-compensation technique has been implemented in order to mitigate process variations, mainly dominated by the contributions of the current reference circuit.
(2018). Temperature Sensor with Process and Mismatch Auto-Compensation Technique in 28 nm CMOS . Retrieved from http://hdl.handle.net/10446/131818
Temperature Sensor with Process and Mismatch Auto-Compensation Technique in 28 nm CMOS
Traversi, Gianluca
2018-01-01
Abstract
This work concerns the design of a temperature sensor for multi-purpose pattern recognition applications de- signed in a 28 nm CMOS technology. The sensor resolution is 1°C between −40°C and 125°C. A vertical bipolar transistor is used as the sensing element generating the reference for the Analog-to-Digital Converter (ADC), based on a dual slope, Wilkinson architecture. An auto-compensation technique has been implemented in order to mitigate process variations, mainly dominated by the contributions of the current reference circuit.| File | Dimensione del file | Formato | |
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