This paper is concerned with the design criteria and the experimental characterization and simulation results relevant to front-end electronics in 130 nm CMOS technology for the readout of monolithic active pixel sensors (MAPS) using a deep N-well (DNW) as their collecting electrode. As compared to the conventional 3T scheme, the one proposed here lends itself to sparsified processing of the data directly at the pixel level and is expected to be able to deal with the large flow of information anticipated for future, high luminosity particle accelerators. The work will present a brief summary of the characterization results relevant to the first two DNW-MAPS prototypes, the Apsel0 and Apsel1 chips, focusing particularly on the front-end processor features and performances. Further developments in the design of the readout electronics are presently under way, in order to comply with power dissipation and spatial resolution constraints set by the experiments for the next generation colliders. Such developments include the design of a DNW-MAPS chip, with sparsified readout and time stamping capabilities, for application to the ILC vertex detector, which will be described in this work together with a selection of the relevant simulation results.

(2007). Design and Performance of Analog Circuits for DNW-MAPS in 100-nm-scale CMOS Technology [book chapter - capitolo di libro]. Retrieved from http://hdl.handle.net/10446/19865

Design and Performance of Analog Circuits for DNW-MAPS in 100-nm-scale CMOS Technology

MANGHISONI, Massimo;RE, Valerio;TRAVERSI, Gianluca
2007-01-01

Abstract

This paper is concerned with the design criteria and the experimental characterization and simulation results relevant to front-end electronics in 130 nm CMOS technology for the readout of monolithic active pixel sensors (MAPS) using a deep N-well (DNW) as their collecting electrode. As compared to the conventional 3T scheme, the one proposed here lends itself to sparsified processing of the data directly at the pixel level and is expected to be able to deal with the large flow of information anticipated for future, high luminosity particle accelerators. The work will present a brief summary of the characterization results relevant to the first two DNW-MAPS prototypes, the Apsel0 and Apsel1 chips, focusing particularly on the front-end processor features and performances. Further developments in the design of the readout electronics are presently under way, in order to comply with power dissipation and spatial resolution constraints set by the experiments for the next generation colliders. Such developments include the design of a DNW-MAPS chip, with sparsified readout and time stamping capabilities, for application to the ILC vertex detector, which will be described in this work together with a selection of the relevant simulation results.
2007
Inglese
IEEE Nuclear Science Symposium Conference Record. Vol. 2
9781424405619
2
681
686
online
file su supporto
IEEE
2006 IEEE Nuclear Science Symposium, Medical Imaging Conference and 15th International Workshop on Room-Temperature Semiconductor X- and Gamma-Ray Detectors
San Diego, CA, US
29 October - 4 November 2006
IEEE
internazionale
contributo
Settore ING-INF/01 - Elettronica
CMOS; Deep N-well; Low noise electronics; MAPS; Threshold dispersion;
technological research; microelectronics; deep submicron; CMOS; semiconductor sensors
2006 IEEE Nuclear Science Symposium and Medical Imaging Conference, 29 ottobre -2 novembre 2006, San Diego (USA) L’articolo si colloca nel contesto della ricerca sui dispositivi elettronici nelle tecnologie più avanzate oggi disponibili. Si tratta di dispositivi basati su strati di ossido di silicio di pochi nanometri, e con definizione geometrica dell’ordine di 100 nanometri, che trovano applicazione nei più innovativi sistemi di telecomunicazioni e di elaborazione delle informazioni. Si tratta di settori di ricerca fra i più attivi a livello scientifico internazionale. L’articolo presenta nuovi sensore monolitico a pixel attivi fabbricato in tecnologia CMOS 130 nm. Rispetto agli image sensor CMOS tradizionali, in questi nuovi dispositivi tutta l’elettronica analogica e digitale di elaborazione di segnale è integrata nel singolo pixel, sfruttando le potenzialità di una tecnologia CMOS “nanoscale”. La soluzione originale proposta con i nuovi sensori riveste notevole interesse dal punto di vista della fisica e della tecnologia dei dispositivi, e si inserisce in un campo di ricerca scientifica molto importante come l’imaging in applicazioni mediche e scientifiche (scienza dei materiali, esperimenti di fisica delle alte energie).
info:eu-repo/semantics/conferenceObject
5
Ratti, Lodovico; Manghisoni, Massimo; Re, Valerio; Speziali, Valeria; Traversi, Gianluca
1.4 Contributi in atti di convegno - Contributions in conference proceedings::1.4.01 Contributi in atti di convegno - Conference presentations
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273
(2007). Design and Performance of Analog Circuits for DNW-MAPS in 100-nm-scale CMOS Technology [book chapter - capitolo di libro]. Retrieved from http://hdl.handle.net/10446/19865
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