In this paper, we report a few examples showing how energy dispersive XRF analysis (EDXRF) coupled with visible reflectance spectroscopy (vis-RS) can be successfully applied for the investigation of wood or canvas paintings by performing stratigraphic analyses with non-invasive techniques. The specific aim is to reconstruct layers and their thicknesses. The method has been tested in the laboratory on paint layers similar to traditional Renaissance ones. In situ analyses of a famous wood painting by Andrea Mantegna - 'Madonna col bambino e un coro di cherubini', Pinacoteca di Brera, Milan - were also carried out. While illustrating the results concerning the identification of pigments and the discrimination of layer stratigraphy, advantages and limitation of this method are pointed out. Copyright © 2007 John Wiley & Sons, Ltd.

(2007). In situ non-invasive EDXRF analysis to reconstruct stratigraphy and thickness of Renaissance pictorial multilayers [journal article - articolo]. In X-RAY SPECTROMETRY. Retrieved from https://hdl.handle.net/10446/243230

In situ non-invasive EDXRF analysis to reconstruct stratigraphy and thickness of Renaissance pictorial multilayers

Poldi G.;
2007-01-01

Abstract

In this paper, we report a few examples showing how energy dispersive XRF analysis (EDXRF) coupled with visible reflectance spectroscopy (vis-RS) can be successfully applied for the investigation of wood or canvas paintings by performing stratigraphic analyses with non-invasive techniques. The specific aim is to reconstruct layers and their thicknesses. The method has been tested in the laboratory on paint layers similar to traditional Renaissance ones. In situ analyses of a famous wood painting by Andrea Mantegna - 'Madonna col bambino e un coro di cherubini', Pinacoteca di Brera, Milan - were also carried out. While illustrating the results concerning the identification of pigments and the discrimination of layer stratigraphy, advantages and limitation of this method are pointed out. Copyright © 2007 John Wiley & Sons, Ltd.
articolo
2007
Bonizzoni, L.; Galli, A.; Poldi, Gianluca; Milazzo, M.
(2007). In situ non-invasive EDXRF analysis to reconstruct stratigraphy and thickness of Renaissance pictorial multilayers [journal article - articolo]. In X-RAY SPECTROMETRY. Retrieved from https://hdl.handle.net/10446/243230
File allegato/i alla scheda:
File Dimensione del file Formato  
X-Ray Spectrometry - 2007 - Bonizzoni - In situ non‐invasive EDXRF analysis to reconstruct stratigraphy and thickness of.pdf

Solo gestori di archivio

Versione: publisher's version - versione editoriale
Licenza: Licenza default Aisberg
Dimensione del file 424.89 kB
Formato Adobe PDF
424.89 kB Adobe PDF   Visualizza/Apri
Pubblicazioni consigliate

Aisberg ©2008 Servizi bibliotecari, Università degli studi di Bergamo | Terms of use/Condizioni di utilizzo

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10446/243230
Citazioni
  • Scopus 36
  • ???jsp.display-item.citation.isi??? 35
social impact