This work presents the design of a read-out channel suitable for application to silicon pixel detectors for the next generation Free Electron Laser (FEL) experiments. The readout architecture, which has been carried out in a 65 nm CMOS technology, consists of a low-noise charge sensitive amplifier (CSA) with dynamic signal compression, a time-variant shaping stage and a low-power analog-to-digital converter (ADC), hosted in a 100 μm-pitch pixel. The blocks will be operated in such a way to cope with the high frame rates (exceeding 1 MHz) foreseen for future X-ray FEL machines. The paper describes in detail the architecture and the performance of the CSA and provides an overview about the analog readout channel.

(2016). Low-noise readout channel with a novel dynamic signal compression for future X-FEL applications . Retrieved from http://hdl.handle.net/10446/79594

Low-noise readout channel with a novel dynamic signal compression for future X-FEL applications

COMOTTI, Daniele;FABRIS, LORENZO;MANGHISONI, Massimo;RE, Valerio;TRAVERSI, Gianluca;
2016-01-01

Abstract

This work presents the design of a read-out channel suitable for application to silicon pixel detectors for the next generation Free Electron Laser (FEL) experiments. The readout architecture, which has been carried out in a 65 nm CMOS technology, consists of a low-noise charge sensitive amplifier (CSA) with dynamic signal compression, a time-variant shaping stage and a low-power analog-to-digital converter (ADC), hosted in a 100 μm-pitch pixel. The blocks will be operated in such a way to cope with the high frame rates (exceeding 1 MHz) foreseen for future X-ray FEL machines. The paper describes in detail the architecture and the performance of the CSA and provides an overview about the analog readout channel.
2016
Comotti, Daniele; Fabris, Lorenzo; Grassi, M.; Lodola, L.; Malcovati, P.; Manghisoni, Massimo; Ratti, L.; Re, Valerio; Traversi, Gianluca; Vacchi, C.; Batignani, G.; Bettarini, S.; Casarosa, G.; Forti, F.; Morsani, F.; Paladino, A.; Paoloni, E.; Rizzo, G.; Benckechkache, M. A.; Dalla Betta, G. F.; Mendicino, R.; Pancheri, L.; Verzellesi, G.; Xu, H.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10446/79594
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