Saccharomyces cerevisiae yeast cells had been characterised in order to study the entity of cell damage following an exposure to soft X-rays and to develop an analytical spherical model of cells to have an estimation of dose and energy deposition inside different cell compartments. In this paper we present the measurement of average cell radius, nucleus radius, wall thickness and cell shape and concentration obtained with Soft X-ray Contact Microscopy (SXCM), Transmission Electron Microscopy (TEM), Optical Microscopy, Coulter Counter and FIB.

Characterisation of Saccharomyces cerevisiae yeast cells

PREVIDI, Fabio;
1998-01-01

Abstract

Saccharomyces cerevisiae yeast cells had been characterised in order to study the entity of cell damage following an exposure to soft X-rays and to develop an analytical spherical model of cells to have an estimation of dose and energy deposition inside different cell compartments. In this paper we present the measurement of average cell radius, nucleus radius, wall thickness and cell shape and concentration obtained with Soft X-ray Contact Microscopy (SXCM), Transmission Electron Microscopy (TEM), Optical Microscopy, Coulter Counter and FIB.
1998
Batani, Dimitri; Masini, Alessandra; Lora Lamia Donin, C.; Cotelli, F.; Previdi, Fabio; Milani, Marziale; Faral, B.; Conte, E.; Moret, M.; Poletti, G.; Pozzi, Achille
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10446/87238
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