(2011). Characterisation of a thin, fully-depleted, back-illuminated SOI pixel sensor with soft X-ray radiation . Retrieved from http://hdl.handle.net/10446/187155

Characterisation of a thin, fully-depleted, back-illuminated SOI pixel sensor with soft X-ray radiation

Mattiazzo, Serena;
2011-01-01
WOS:000304755601055
2-s2.0-84858638846
2011
Inglese
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
978-1-4673-0120-6
1057
1059
online
United States
Piscataway
IEEE (Institute of Electrical and Electronics Engineers)
non referato
NSS/MIC 2011: IEEE Nuclear Science Symposium and Medical Imaging Conference, Valencia, Spain, 23-29 October 2011
Valencia (Spain)
23-29 October 2011
IEEE (Institute of Electrical and Electronics Engineers)
internazionale
contributo
Settore FIS/01 - Fisica Sperimentale
info:eu-repo/semantics/conferenceObject
9
Battaglia, Marco; Bisello, Dario; Celestre, Richard; Contarato, Devis; Denes, Peter; Giubilato, Piero; Mattiazzo, Serena; Pantano, Devis; Tindall, Cra...espandi
1.4 Contributi in atti di convegno - Contributions in conference proceedings::1.4.01 Contributi in atti di convegno - Conference presentations
reserved
Non definito
273
(2011). Characterisation of a thin, fully-depleted, back-illuminated SOI pixel sensor with soft X-ray radiation . Retrieved from http://hdl.handle.net/10446/187155
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10446/187155
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