At the INFN Legnaro Laboratories (Padova, Italy) a new instrument has been recently installed in the SIRAD beam line, a facility devoted to the study of radiation induced damage in microelectronic devices, systems and materials. This new instrument, based on an idea first proposed at SANDIA, consists of an electronic microscope system capable of recognizing with micrometric resolution the impact points of single ions impinging on the target. Linking the ion impact positions as recorded by the microscope with the single event effects (SEE) induced in a microelectronic component under test (DUT) allows one to perform a micro-map of the sensitive areas of the device under test. Compared with traditional microbeams, the standard tool to perform SEE micro mapping, an IEEM system is relatively simple and it may be installed on preexisting beam-lines with only minor requirements, an important feature that allows IEEM applications at high-energy ion accelerators that allow a wide selection of ion species (cyclotrons, tandems).

(2006). Ion Electron Emission Microscopi for SEE studies . Retrieved from http://hdl.handle.net/10446/187163

Ion Electron Emission Microscopi for SEE studies

Mattiazzo, S.;
2006-01-01

Abstract

At the INFN Legnaro Laboratories (Padova, Italy) a new instrument has been recently installed in the SIRAD beam line, a facility devoted to the study of radiation induced damage in microelectronic devices, systems and materials. This new instrument, based on an idea first proposed at SANDIA, consists of an electronic microscope system capable of recognizing with micrometric resolution the impact points of single ions impinging on the target. Linking the ion impact positions as recorded by the microscope with the single event effects (SEE) induced in a microelectronic component under test (DUT) allows one to perform a micro-map of the sensitive areas of the device under test. Compared with traditional microbeams, the standard tool to perform SEE micro mapping, an IEEM system is relatively simple and it may be installed on preexisting beam-lines with only minor requirements, an important feature that allows IEEM applications at high-energy ion accelerators that allow a wide selection of ion species (cyclotrons, tandems).
2006
Giubilato, P.; Bisello, D.; Kaminiski, A.; Mattiazzo, Serena; Nigro, M.; Pantano, D.; Rando, M.; Tessaro, M.; Wyss, J.
File allegato/i alla scheda:
Non ci sono file allegati a questa scheda.
Pubblicazioni consigliate

Aisberg ©2008 Servizi bibliotecari, Università degli studi di Bergamo | Terms of use/Condizioni di utilizzo

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10446/187163
Citazioni
  • Scopus 0
  • ???jsp.display-item.citation.isi??? ND
social impact