The SIRAD irradiation facility is located at the Tandem-ALPI accelerating system of the INFN National Laboratories of Legnaro, Italy. SIRAD is devoted to Single Event Effects and bulk damage studies on semiconductor detectors and electronic devices and systems. Here we describe the status of SIRAD by reporting the characteristics of the ion beams, of the irradiation chamber and of the monitoring and dosimetry systems for particle fluence measurements. The Ion Electron Emission Microscope which allows micrometric SEE sensitivity mapping is also briefly described. Single Event Upset (SEU) cross-section measurements of the ESA SEU monitor, presented here, show full compatibility with those obtained at irradiation facilities supported by ESA.
(2013). Status and prospects of the SIRAD irradiation facility for radiation effects studies at LNL . Retrieved from http://hdl.handle.net/10446/187181
Status and prospects of the SIRAD irradiation facility for radiation effects studies at LNL
S. Mattiazzo;
2013-01-01
Abstract
The SIRAD irradiation facility is located at the Tandem-ALPI accelerating system of the INFN National Laboratories of Legnaro, Italy. SIRAD is devoted to Single Event Effects and bulk damage studies on semiconductor detectors and electronic devices and systems. Here we describe the status of SIRAD by reporting the characteristics of the ion beams, of the irradiation chamber and of the monitoring and dosimetry systems for particle fluence measurements. The Ion Electron Emission Microscope which allows micrometric SEE sensitivity mapping is also briefly described. Single Event Upset (SEU) cross-section measurements of the ESA SEU monitor, presented here, show full compatibility with those obtained at irradiation facilities supported by ESA.Pubblicazioni consigliate
Aisberg ©2008 Servizi bibliotecari, Università degli studi di Bergamo | Terms of use/Condizioni di utilizzo