The development of new experiments such as CLIC and the the foreseen Phase 2 pixel upgrades of ATLAS and CMS have very challenging requirements for the design of hybrid pixel readout chips, both in terms of performances and reliability. To face these challenges, the use of a more downscaled CMOS technology compared to previous projects is necessary. The CERN RD53 collaboration is undertaking a R&D programme to evaluate the use of a commercial 65 nm technology and to develop tools and frameworks which will help to design future pixel detectors. This paper gives a short overview of the RD53 collaboration activities and describes some examples of recent developments.

(2015). 65 nm Technology for HEP: Status and Perspective . In POS PROCEEDINGS OF SCIENCE. Retrieved from http://hdl.handle.net/10446/84100

65 nm Technology for HEP: Status and Perspective

Mattiazzo, S.;Gaioni, L.;Manghisoni, M.;Re, V.;Traversi, G.;
2015-01-01

Abstract

The development of new experiments such as CLIC and the the foreseen Phase 2 pixel upgrades of ATLAS and CMS have very challenging requirements for the design of hybrid pixel readout chips, both in terms of performances and reliability. To face these challenges, the use of a more downscaled CMOS technology compared to previous projects is necessary. The CERN RD53 collaboration is undertaking a R&D programme to evaluate the use of a commercial 65 nm technology and to develop tools and frameworks which will help to design future pixel detectors. This paper gives a short overview of the RD53 collaboration activities and describes some examples of recent developments.
2015
Inglese
Vertex2014 - The 23rd International Workshop on Vertex Detectors, 15-19 September 2014, Macha Lake, The Czech Republic
227
1
10
online
Italy
Trieste
Scuola Internazionale Superiore di Studi Avanzati
esperti anonimi
Vertex2014 - The 23rd International Workshop on Vertex Detectors, Macha Lake, Czech Republic, 15-19 September 2014
23rd
Macha Lake (Czech Republic)
15-19 September 2014
internazionale
su invito
Settore ING-INF/01 - Elettronica
info:eu-repo/semantics/conferenceObject
123
Barbero, M. B.; Fougeron, D.; Gensolen, F.; Godiot, S.; Mmenouni, M.; Pangaud, P.; Rozanov, A.; Wang, A.; Bomben, M.; Calderini, G.; Crescioli, F.; Ge...espandi
1.4 Contributi in atti di convegno - Contributions in conference proceedings::1.4.01 Contributi in atti di convegno - Conference presentations
open
Non definito
273
(2015). 65 nm Technology for HEP: Status and Perspective . In POS PROCEEDINGS OF SCIENCE. Retrieved from http://hdl.handle.net/10446/84100
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